| Project Title: |
Trace Elemental Analysis Of Glass Via PIXE |
| Student Name: |
Derek Padilla (with Chris Hall) |
| Student's Home Institution: |
San Diego State |
| Research Advisor: |
Dr. Paul DeYoung and Dr. Graham Peaslee |
| Source of Support: |
National Science Foundation under Grant Numbers 0452206, 0354920 and 0319523. |
Using the Hope College Ion Beam Analysis Laboratory (HIBAL), protons with an energy of 2.3 MeV are accelerated towards the prepared samples in an evacuated target chamber. Resultant x-rays are detected at 45º with a Si(Li) detector. The x-ray spectra are analyzed with the GUPIXWIN peak-fitting software which outputs relative concentrations of trace elements. With these relative concentrations, ratios between trace elements are used for the comparative aspect of the statistics. This use of ratios eliminates much systematic error that arises when trying to acquire absolute concentrations. Specific ratios between samples are compared using Z-score testing which gives a scale of the difference between the two samples for that particular elemental ratio. When comparing two hits on the same sample, there still remains a difference in the trace elemental concentrations of that same sample due to statistical errors. This difference is used as a control in our evaluations of unknown sample concentrations. To obtain reliable statistics, multiple spectra are always obtained on each sample.