Publications of the Microwave Group at Hope College

2009-present

*indicates undergraduate student co-author

1. Brooke M. Jeries*, Sean R. Cratty*, and S.K. Remillard, "Probing the Locally Generated Even and Odd Order Nonlinearity in Y-Ba-Cu-O and Tl-Ba-Ca-Cu-O (2212) Microwave Resonators around TC," Accepted for publication in IEEE Trans. on Applied Superconductivity, in the June 2013 issue.
2. TJ Klein*, Cameron J. Recknagel*, Christopher J. Ploch*, and S.K. Remillard, "Microwave Breakdown of Low Pressure N2 Gas in Microgaps", Applied Physics Letters, Vol.99, no.12, 121503, (2011). <http://apl.aip.org/resource/1/applab/v99/i12/p121503_s1>
   
3. Annelle M. Eben*, V. Andrew Bunnell*, Candace J. Goodson*, Evan K. Pease*, Sheng-Chiang Lee, and S.K. Remillard, "Even and Odd Order Nonlinearity from Superconductive Microstrip Lines," IEEE Trans. on Applied Superconductivity, Vol. 21, no. 3, pp. 595-598, (2011).
4. A. P. Zhuravel, Steven M. Anlage, Stephen K. Remillard, A. V. Lukashenko, and A. V. Ustinov, "Effect of LaAlO3 twin-domain topology on local dc and microwave properties of cuprate films", Journal of Applied Physics, Vol. 108, 033920 (2010).
5. S.K. Remillard, "Simultaneous and Synchronous Measurement of Even and Odd Order Nonlinear Distortion Terms," Proceedings of PIERS 2010, Cambridge, MA, July 5-8, pp. 1120-1122 (2010).
6. Evan K. Pease*, Bradley J. Dober*, and S.K. Remillard, "Synchronous measurement of even and odd order intermodulation distortion at the resonant frequency of a superconducting resonator", Review of Scientific Instruments, vol. 81, 024701 (2010). <http://rsi.aip.org/rsinak/v81/i2/p024701_s1?isAuthorized=no>
7. S. K. Remillard, A. Hardaway*, B. Mork, J. Gilliland*, and J. Gibbs*, "Using a re-entrant microwave resonator to measure and model the dielectric breakdown electric field of gases," Progress In Electromagnetics Research, Vol. B15, pp. 175-195 (2009).
8. C. Isaac Angert* and S.K. Remillard, "Dispersion in One-Dimensional Photonic Band Gap Periodic Transmission Lines," Microwave and Optical Technology Letters, 51, no. 4, 1010-1013 (2009).
   <http://www3.interscience.wiley.com/journal/121685968/abstract>